We present a novel approach to achieve hyper spectral resolution, high sensitive detection, and high speed data acquisition Stimulated Raman Spectroscopy by employing amplified offset-phase controlled fs-pulse bursts. In this approach, the Raman-shift spectrum is obtained through the direct mapping between the bursts offset phase and the Raman-shift frequency, which requires neither wavelength-detuning as in the long-pulse method nor precise dispersion management and delay scanning with movable parts as in the spectral focusing technique. This method is demonstrated numerically by solving the coupled non-linear Schroedinger equations and the properties of this approach are systematically investigated. The product of the spectral resolution and the pixel dwell time in this work is below 2 microsiemens/centimeter, which is at least an order of magnitude lower than previous methods. This previously untouched area will greatly expand the applications of SRS and holds the potential for discovering new science.
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