Low-Energy Electron Diffraction (LEED) is a commonly employed technique for surface structure characterization. It can provide quick, qualitative insights into surface periodicity and ordering. However, simple LEED analysis overlooks a large amount of quantitative information that is contained in the diffracted electron beams. This additional information is extracted by LEED I(V) via analysis of beam intensities as a function of the electron acceleration voltage. LEED I(V) can be a powerful tool for surface structure investigation, as the curves are sensitive surface atom positions at the picometer scale. Comparison of measured and theoretical intensities gives a strong test for surface structure models. Yet, LEED I(V) remains an underutilized technique because current software solutions are lacking in usability to a degree that makes them inaccessible for routine applications for all but few specialized groups. To overcome this issue, we present the Vienna Package for TensErLEED (ViPErLEED) which aims to provide a unique all-in-one package for LEED I(V). On the hardware side, ViPErLEED includes freely available schematics for electronics to easily upgrade existing LEED setups without extensive modifications. On the software side, we introduce a spot-tracking tool for I(V) curve extraction and an overhaul for the established TensErLEED package including automatic input and output handling.