Stöger-Pollach, M., Becer, F., & Scales, Z. (2024). Beam damage free sample investigations of GaN related materials employing cathodoluminescence. In G. Leitinger, G. Kothleitner, & Österreichische Gesellschaft für Elektronenmikroskopie (Eds.), 14th ASEM Workshop on Advanced Electron Microscopy (pp. 87–87). https://doi.org/10.34726/6359
