Beam damage free sample investigations of GaN related materials employing cathodoluminescence

Stöger-Pollach, Michael; Becer, Firat; Scales, Ze

doi:10.34726/6359

Record link:

http://hdl.handle.net/20.500.12708/197700
https://doi.org/10.34726/6359

Title:

Beam damage free sample investigations of GaN related materials employing cathodoluminescence

Citation:

Stöger-Pollach, M., Becer, F., & Scales, Z. (2024). Beam damage free sample investigations of GaN related materials employing cathodoluminescence. In G. Leitinger & G. Kothleitner (Eds.), 14th ASEM Workshop on Advanced Electron Microscopy (pp. 87–87). https://doi.org/10.34726/6359

reposiTUm DOI:

10.34726/6359

CatalogPlus:

AC17207701

Publication Type:

Inproceedings - Abstract Book Contribution

Language:

English

Authors:

Stöger-Pollach, Michael
Becer, Firat
Scales, Ze

Organisational Unit:

E057-02 - Fachbereich Universitäre Serviceeinrichtung für Transmissions- Elektronenmikroskopie