Record link: 
https://doi.org/10.34726/hss.2024.111400
http://hdl.handle.net/20.500.12708/197723
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Title: 
Exploring the phase space of TM-Si-B2 materials by DFT based methods
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Citation: 
Gutschka, C. (2024). Exploring the phase space of TM-Si-B2 materials by DFT based methods [Diploma Thesis, Technische Universität Wien]. reposiTUm. https://doi.org/10.34726/hss.2024.111400
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reposiTUm DOI: 
10.34726/hss.2024.111400
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CatalogPlus: 
AC17192417
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Publication Type: 
Thesis - Diplomarbeit
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Language: 
English
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Authors: 
Gutschka, Christian 
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Advisor: 
Riedl-Tragenreif, Helmut 
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Organisational Unit: 
E308 - Institut für Werkstoffwissenschaft und Werkstofftechnologie 
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Date (published): 
2024
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Number of Pages: 
80
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Keywords: 
DFT; Thin Film Materials
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License: 
In Copyright
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