With the increasing fidelity of modern, pixelated CCD-based X-ray detectors, which provide direct detection of X-rays with both energy and spatial resolution, new techniques in the field of X-ray analytical methods have become possible. Elemental Mapping can be performed by Full Field X-ray Fluorescence analysis [1] where the whole sample is illuminated by an X-ray beam and – via an appropriate optic between sample and detector - yields an image directly on the detector screen. As every pixel yields a full X-ray spectrum the image can be interpreted as an Elemental Map of the sample Here, a novel instrument, the X-ray Color Camera microscope, based on a one megapixel pnCCD detector [2] with a pixel size of 75*75µm, a readout rate of up to 400 Hz and an energy resolution of 160 eV at 6 keV for every pixel, will be used together with a lab X-ray source to showcase this technique. With a simple pinhole as the imaging optic, mounted on a movable arm, different magnifications can be realized by just changing the distance between sample and optics. A variety of samples will be shown to emphasize the viability of this technique. [1] U. Fittschen, O. Scharf and M. Menzel, Full-Field X-ray Fluorescence Microscopy Using a Color X-ray Camera, Microscopy Today 23(3),2015, 36 [2] Lothar Strüder, et al. Large-format, high-speed, X-ray pnCCDs combined with electron and ion imaging spectrometers in a multipurpose chamber for experiments at 4th generation light sources, Nucl. Instrum. Methods Phys. Res. Sect. A (214), 2010, 483 – 496.