Khodabakhshi, F., Kampel, I., Yakymovych, A., Wilde, G., & Khatibi Damavandi, G. (2024). Atom probe tomography (APT) characterization of intermetallic compounds (IMC) layer after soldering [Conference Presentation]. Material Science and Engineering MSE 2024, Darmstadt, Germany. http://hdl.handle.net/20.500.12708/210420