Hahn, R., Janknecht, R., Koutna, N., Todt, J., Meindlhumer, M., Davydok, A., Kolozsvári, S., Keckes, J., Mayrhofer, P. H., & Riedl, H. (2024, June 19). Measuring Thin Film Elastic Constants using Combined X-ray Microdiffraction and Micromechanical Testing [Conference Presentation]. 6th ICASS, Wuzhen, China. http://hdl.handle.net/20.500.12708/210855