Record link: 
http://hdl.handle.net/20.500.12708/211099
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Title: 
GIMOXS - a spectrometer for GIXRF and TXRF for the nondestructive characterization of nanomaterials including light elements in the laboratory
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Citation: 
Ingerle, D., Meirer, F., Siebers, K., Wobrauschek, P., & Streli, C. (2024). GIMOXS - a spectrometer for GIXRF and TXRF for the nondestructive characterization of nanomaterials including light elements in the laboratory. In A. Karydas (Ed.), EXRS 2024 : Book of Abstracts (pp. 199–199). http://hdl.handle.net/20.500.12708/211099
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Publication Type: 
Inproceedings - Abstract Book Contribution
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Language: 
English
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Authors: 
Ingerle, Dieter 
Meirer, Florian 
Siebers, Kirsten 
Wobrauschek, Peter 
Streli, Christina 
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Organisational Unit: 
E057-04 - Fachbereich Röntgenzentrum 
E141-05 - Forschungsbereich Radiation Physics 
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Published in: 
EXRS 2024 : Book of Abstracts 
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Date (published): 
2024
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Event name: 
European X-ray Spectrometry Conference (EXRS 2024) 
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Event date: 
24-Jun-2024 - 28-Jun-2024
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Event place: 
Athen, Greece
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Number of Pages: 
1
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Keywords: 
GIXRF
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Research facilities: 
Röntgenzentrum 
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Project title: 
Nanoplastic characterization with a TXRF spectrometer for the determination of light elements: LZTXRF_NPL 2021-06-01 (Universiteit Utrecht) 
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Research Areas: 
Materials Characterization: 100%
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Science Branch: 
1040 - Chemie: 50%
1030 - Physik, Astronomie: 50%
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Appears in Collections:
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