Record link: 
http://hdl.handle.net/20.500.12708/213467
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Title: 
Uncertainty Quantification in Semiconductor Models
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Citation: 
Taghizadeh, L. (2025, February 20). Uncertainty Quantification in Semiconductor Models [Conference Presentation]. 3rd IACM Digital Twins in Engineering Conference (DTE 2025) & 1st ECCOMAS Artificial Intelligence and Computational Methods in Applied Science (AICOMAS 2025), Paris, France. http://hdl.handle.net/20.500.12708/213467
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Publication Type: 
Presentation - Conference Presentation
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Language: 
English
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Authors: 
Taghizadeh, Leila 
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Organisational Unit: 
E101-03-2 - Forschungsgruppe Unsicherheitsquantifizierung 
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Date (published): 
20-Feb-2025
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Event name: 
3rd IACM Digital Twins in Engineering Conference (DTE 2025) & 1st ECCOMAS Artificial Intelligence and Computational Methods in Applied Science (AICOMAS 2025) 
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Event date: 
17-Feb-2025 - 21-Feb-2025
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Event place: 
Paris, France
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Keywords: 
Uncertainty quantification; Bayesian Inverse problems; semiconductor models
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Project title: 
Rechnerische Unsicherheitsquantifizierung in Nanotechnologie: V 1000-N (FWF - Österr. Wissenschaftsfonds) 
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Research Areas: 
Mathematical and Algorithmic Foundations: 100%
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Science Branch: 
1010 - Mathematik: 100%
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