Record link: 
http://hdl.handle.net/20.500.12708/219813
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Title: 
3D TCAD simulation of current filamentation and IV hysteresis behavior in ESD protection SCRs
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Citation: 
Pichan, R., Krainer, R., Holland, S., Ritter, H.-M., VASANTA KUMAR, V., & Pogany, D. (2025, May 12). 3D TCAD simulation of current filamentation and IV hysteresis behavior in ESD protection SCRs [Conference Presentation]. International ESD workshop, Zagreb, Croatia. http://hdl.handle.net/20.500.12708/219813
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Publication Type: 
Presentation - Conference Presentation
en
Language: 
English
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Authors: 
Pichan, Rincy 
Krainer, Rudolf 
Holland, Steffen 
Ritter, H.-M. 
VASANTA KUMAR, VEMURI 
Pogany, Dionyz 
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Organisational Unit: 
E362-02 - Forschungsbereich Nanoelektronische Bauelemente 
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Date (published): 
12-May-2025
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Event name: 
International ESD workshop 
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Event date: 
12-May-2025 - 16-May-2025
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Event place: 
Zagreb, Croatia
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Keywords: 
3D TCAD; simulation
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Research Areas: 
Materials Characterization: 50%
Nanoelectronics: 50%
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Science Branch: 
2020 - Elektrotechnik, Elektronik, Informationstechnik: 100%
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Appears in Collections:
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