Record link: 
http://hdl.handle.net/20.500.12708/221071
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Title: 
Ion Beam-induced MoS2 Surface Modification: An XPSStudy of Ar+ and Ar Gas Cluster Ion Beam Treatments
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Citation: 
Laudani, F., Sauer, M., Polyushkin, D., Pettorosso, L., Rath, J., Hemetsberger, J., & Foelske, A. (2025, September 26). Ion Beam-induced MoS2 Surface Modification: An XPSStudy of Ar+ and Ar Gas Cluster Ion Beam Treatments [Conference Presentation]. AVS 71 International Symposium and Exhibition, Charlotte, United States of America (the).
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Publication Type: 
Presentation - Conference Presentation
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Language: 
English
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Authors: 
Laudani, Francesco 
Sauer, Markus 
Polyushkin, Dmitry 
Pettorosso, Lorenzo 
Rath, Jakob 
Hemetsberger, Jakob 
Foelske, Annette 
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Organisational Unit: 
E057-05 - Fachbereich Analytical Instrumentation Center 
E056-04 - Fachbereich TU-DX: Towards Applications of 2D Materials 
E387-01 - Forschungsbereich Photonik 
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Date (published): 
26-Sep-2025
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Event name: 
AVS 71 International Symposium and Exhibition 
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Event date: 
21-Sep-2025 - 26-Sep-2025
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Event place: 
Charlotte, United States of America (the)
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Keywords: 
MoS2; Ion beam; XPS; monolayer
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Research facilities: 
Analytical Instrumentation Center 
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Project title: 
Elektrochemischer Oberflächen- und Grenzflächen- Analytik Cluster: 884672 (FFG - Österr. Forschungsförderungs- gesellschaft mbH) 
TUD-X: Anwendungen von 2D Materialien: DOC 142-N (FWF - Österr. Wissenschaftsfonds) 
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Research Areas: 
Materials Characterization: 30%
Surfaces and Interfaces: 30%
Structure-Property Relationsship: 40%
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Science Branch: 
1040 - Chemie: 60%
1030 - Physik, Astronomie: 40%
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Appears in Collections:
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