Record link: 
http://hdl.handle.net/20.500.12708/221339
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Title: 
Investigation of Atomic-Scale Decorations on Mixed Conducting Oxides via Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS)
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Citation: 
Fahrnberger, F., Siebenhofer, M., Hutter, H., & Kubicek, M. (2023, September 4). Investigation of Atomic-Scale Decorations on Mixed Conducting Oxides via Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) [Conference Presentation]. SIMS Europe 2023, Nottingham, United Kingdom of Great Britain and Northern Ireland (the). http://hdl.handle.net/20.500.12708/221339
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Publication Type: 
Presentation - Conference Presentation
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Language: 
English
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Authors: 
Fahrnberger, Florian 
Siebenhofer, Matthäus 
Hutter, Herbert 
Kubicek, Markus 
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Organisational Unit: 
E164 - Institut für Chemische Technologien und Analytik 
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Date (published): 
4-Sep-2023
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Event name: 
SIMS Europe 2023 
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Event date: 
3-Sep-2023 - 5-Sep-2023
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Event place: 
Nottingham, United Kingdom of Great Britain and Northern Ireland (the)
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Keywords: 
Mixed ionic electronic oxides; Oxidic decorations; Secondary ion formation; ToF-SIMS
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Research Areas: 
Materials Characterization: 50%
Surfaces and Interfaces: 50%
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Science Branch: 
1040 - Chemie: 100%
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