Record link: 
http://hdl.handle.net/20.500.12708/222594
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Title: 
Comparative Analysis of Native and Degraded Polymers through TOF-SIMS Depth Profiling and Multivariate Statistics
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Citation: 
Willner, J., Kronlachner, L., Podsednik, M., Brunnbauer, L., & Limbeck, A. (2025, October). Comparative Analysis of Native and Degraded Polymers through TOF-SIMS Depth Profiling and Multivariate Statistics [Poster Presentation]. SciX 2025, Covington, United States of America (the).
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Publication Type: 
Presentation - Poster Presentation
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Language: 
English
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Authors: 
Willner, Jakob 
Kronlachner, Laura 
Podsednik, Maximilian 
Brunnbauer, Lukas 
Limbeck, Andreas 
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Organisational Unit: 
E164-01-2 - Forschungsgruppe Oberflächen-, Spurenanalytik und Chemometrie 
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Date (published): 
Oct-2025
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Event name: 
SciX 2025 
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Event date: 
5-Oct-2025 - 10-Oct-2025
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Event place: 
Covington, United States of America (the)
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Keywords: 
LA-ICP-MS; Quantification; Microdroplets
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Research Areas: 
Materials Characterization: 100%
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Science Branch: 
1040 - Chemie: 100%
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