Record link: 
http://hdl.handle.net/20.500.12708/223577
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Title: 
Statistical Enhancement in Two-particle Device Monte Carlo
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Citation: 
Gull, J., & Kosina, H. (2025). Statistical Enhancement in Two-particle Device Monte Carlo. In Proceedings of the Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS) (pp. 82–83).
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Publication Type: 
Inproceedings - Abstract Book Contribution
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Language: 
English
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Authors: 
Gull, Josef 
Kosina, Hans 
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Organisational Unit: 
E360-01 - Forschungsbereich Mikroelektronik 
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Published in: 
Proceedings of the Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS) 
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Date (published): 
2025
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Event name: 
11th Joint EuroSOI Workshop and International Conference on Ultimate Integration of Silicon (EuroSOI-ULIS 2025) 
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Event date: 
14-May-2025 - 16-May-2025
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Event place: 
Warsaw, Poland
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Number of Pages: 
2
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Keywords: 
Monte Carlo transport; Electron-electron scattering; Statistical enhancement
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Project title: 
Wigner Transport Dynamik von verschränkten Elektronen: P 37080-N (FWF - Österr. Wissenschaftsfonds) 
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Research Areas: 
Nanoelectronics: 25%
Modeling and Simulation: 75%
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Science Branch: 
2020 - Elektrotechnik, Elektronik, Informationstechnik: 100%
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Appears in Collections:
Conference Paper

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