Record link: 
http://hdl.handle.net/20.500.12708/225190
-
Title: 
Polarization and Ellipsometry: Unlocking Superior Layer Quality
en
Citation: 
Bammer, F. (2025, May 28). Polarization and Ellipsometry: Unlocking Superior Layer Quality [Interview]. MVPro Online. http://hdl.handle.net/20.500.12708/225190
-
Publication Type: 
Special Contribution - Interview
en
Language: 
English
-
Authors: 
Bammer, Ferdinand 
-
Organisational Unit: 
E311-02-2 - Forschungsgruppe Prozesstechnik 
-
Date (published): 
28-May-2025
-
Number of Pages: 
2
-
Publisher: 
MVPro Online
-
Keywords: 
Ellipsometrie; Qualitätssicherung; Schichtdickenmessung
de
Additional information: 
Link zum Beitrag: https://mvproeurope.com/polarization-and-ellipsometry-unlocking-superior-layer-quality/
-
Research Areas: 
Photonics: 30%
Sustainable Production and Technologies: 70%
-
Science Branch: 
2030 - Maschinenbau: 70%
2050 - Werkstofftechnik: 15%
2020 - Elektrotechnik, Elektronik, Informationstechnik: 15%
-
Appears in Collections:
Special Contribution

Show full item record

Google ScholarTM

Check