Record link: 
http://hdl.handle.net/20.500.12708/225478
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Title: 
Ellipsometric Measurements on Oil-layers on Technical Surfaces
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Citation: 
Bammer, F. (2024). Ellipsometric Measurements on Oil-layers on Technical Surfaces. In K. Hingerl (Ed.), OSI 14 : The 14th International Conference on Optics of Surfaces and Interfaces (pp. 10–10).
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Publication Type: 
Inproceedings - Abstract Book Contribution
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Language: 
English
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Authors: 
Bammer, Ferdinand 
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Organisational Unit: 
E311-02-2 - Forschungsgruppe Prozesstechnik 
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Published in: 
OSI 14 : The 14th International Conference on Optics of Surfaces and Interfaces 
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Date (published): 
20-Feb-2024
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Event name: 
The 14th International Conference on Optics of Surfaces and Interfaces 
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Event date: 
19-Feb-2024 - 23-Feb-2024
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Event place: 
Mauterndorf, Austria
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Number of Pages: 
1
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Keywords: 
Ellipsometry; infrared ellipsometry; quality assurance; Inline Metrology; layer
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Abstract: 
We examine the usefulness of IR-ellipsometry for the measurement of the thickness of oil layers on metals, or more generally, of dielectric layers on metallic substrates. IR-ellipsometry may offer in inline applications like rolling or deep-drawing more robustness than the currently used methods, based on IR-spectroscopy or fluorescence, which are too dependent on the type of substrate and/or the type of oil.
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Project title: 
Bildgebende Echtzeit-Infrarot-Ellipsometrie: 1 (EMG Automation GmbH) 
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Additional information: 
Conference contribution
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Research Areas: 
Photonics: 30%
Sustainable Production and Technologies: 70%
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Science Branch: 
2030 - Maschinenbau: 70%
2050 - Werkstofftechnik: 15%
2020 - Elektrotechnik, Elektronik, Informationstechnik: 15%
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Appears in Collections:
Conference Paper

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