Oliynyk, D., Mayer, R., & Rauber, A. (2025). Attackers Can Do Better: Over- and Understated Factors of Model Stealing Attacks. In 2025 IEEE Conference on Secure and Trustworthy Machine Learning (SaTML) (pp. 150–168). IEEE Xplore. https://doi.org/10.1109/SaTML64287.2025.00016