Record link: 
http://hdl.handle.net/20.500.12708/231209
-
Title: 
Linking Chemical Expansion and Defect Chemistry in Gd-Doped Ceria Thin Films by In-Situ XRD and Impedance Spectroscopy
en
Citation: 
Opitz, A. K., Rath, K., Melcher, C., & Schmid, A. (2026). Linking Chemical Expansion and Defect Chemistry in Gd-Doped Ceria Thin Films by In-Situ XRD and Impedance Spectroscopy. In 25th International Conference on Solid State Ionics : Solid Science for a Sustainable Future : Abstract Book (pp. 293–293).
-
Publication Type: 
Inproceedings - Abstract Book Contribution
en
Language: 
English
-
Authors: 
Opitz, Alexander Karl 
Rath, Kirsten 
Melcher, Christian 
Schmid, Alexander 
-
Organisational Unit: 
E164-04-3 - Forschungsgruppe Festkörperionik 
E164-04-1 - Forschungsgruppe Elektrochemische Energieumwandlung 
-
Published in: 
25th International Conference on Solid State Ionics : Solid Science for a Sustainable Future : Abstract Book 
-
Date (published): 
Jul-2026
-
Event name: 
25th International Conference on Solid State Ionics (SSI 2026) 
en
Event date: 
5-Jul-2026 - 10-Jul-2026
-
Event place: 
Singapore, Singapore
-
Number of Pages: 
1
-
Keywords: 
Defect Chemistry; In-situ XRD; Cera Thin
en
Research Areas: 
Materials Characterization: 50%
Surfaces and Interfaces: 50%
-
Science Branch: 
1040 - Chemie: 100%
-
Appears in Collections:
Conference Paper

Show full item record

Google ScholarTM

Check