Record link: 
http://hdl.handle.net/20.500.12708/231523
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Title: 
The Film Thickness Dependence of Band Alignment at Mixed Ionic and Electronic Conducting Oxide Heterojunctions
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Citation: 
Steinbach, C., Schmid, A., Kubicek, M., & Fleig, J. (2026, July 6). The Film Thickness Dependence of Band Alignment at Mixed Ionic and Electronic Conducting Oxide Heterojunctions [Poster Presentation]. 25th International Conference on Solid State Ionics (SSI 2026), Singapore, Singapore.
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Publication Type: 
Presentation - Poster Presentation
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Language: 
English
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Authors: 
Steinbach, Claudia 
Schmid, Alexander 
Kubicek, Markus 
Fleig, Jürgen 
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Organisational Unit: 
E164-04-1 - Forschungsgruppe Elektrochemische Energieumwandlung 
E164-04-3 - Forschungsgruppe Festkörperionik 
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Date (published): 
6-Jul-2026
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Event name: 
25th International Conference on Solid State Ionics (SSI 2026) 
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Event date: 
5-Jul-2026 - 10-Jul-2026
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Event place: 
Singapore, Singapore
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Keywords: 
Mixed Ionic; Electronic Conducting; Oxide Heterojunctions
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Research Areas: 
Materials Characterization: 50%
Surfaces and Interfaces: 50%
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Science Branch: 
1040 - Chemie: 100%
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Appears in Collections:
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