Yang, K., Guicherd, J., Fleig, J., Lu, Q., Siebenhofer, M., & Kubicek, M. (2026). Simultaneous quantification of ionic conductivity and defect concentrations in mixed ionic and electronic conducting oxide thin films. Solid State Ionics, 446, Article 117298. https://doi.org/10.1016/j.ssi.2026.117298