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Veeravalli, V. S., & Steininger, A. (2016). Study of a Delayed Single-Event Effect in the Muller C-element. In Proc 21st IEEE European Test Symposium. 21st IEEE European Test Symposium, Amsterdam, EU. http://hdl.handle.net/20.500.12708/56885
E191-02 - Forschungsbereich Embedded Computing Systems
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Published in:
Proc 21st IEEE European Test Symposium
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Date (published):
2016
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Event name:
21st IEEE European Test Symposium
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Event date:
24-May-2016 - 27-May-2016
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Event place:
Amsterdam, EU
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Number of Pages:
2
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Peer reviewed:
Yes
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Keywords:
Muller C Element; single-event upset; single-event transient; fault model
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Abstract:
We study the behavior of the Muller C-element, a
fundamental building block in asynchronous design, under SETs.
Beyond the expected reactions to the injected SETs - namely
immediate state flip or pulse at the output - we also observed
an new kind of behavior for the Muller C-element, namely a
delayed state flip. In this paper we give a closer analysis of this
effect and identify its enabling conditions.
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Project title:
Analysis & Modeling of Single-Event-Transients in VLSI Chips: P 26435-N30 (Fonds zur Förderung der wissenschaftlichen Forschung (FWF))
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Research Areas:
Computer Engineering and Software-Intensive Systems: 100%
