Title: Further development of the software jGiXa for grazing incidence X-ray fluoresence analysis
Other Titles: Weiterentwicklung der Auswertesoftware JGIXA für Röntgenfluoreszenzanalyse unter streifendem Einfall
Language: English
Authors: Iro, Michael 
Qualification level: Diploma
Advisor: Streli, Christina  
Assisting Advisor: Ingerle, Dieter 
Issue Date: 2019
Number of Pages: 57
Qualification level: Diploma
Combined Grazing incidence X-Ray fluorescence and X-Ray reflectometry analysis, as proposed by de Boer [1], needs a sophisticated software using global optimization algorithms to fit calculated curves for a specific sample-setup-model to measurement results of angle dependent fluorescence signals from ultra thin layers on a reflecting surface (e.g. Si-wafer). The software package jGiXa, developed by Ingerle [2] for this purpose, used a graphical user interface and optimization algorithms based on MatLab code and a Java based calculation of the spectra. This diploma thesis focuses on the further development of the jGiXa software. Therefor a Java based graphical user interface and global optimization algorithm were implemented, allowing jGiXa to work as a Java standalone software. This is advantageous in respect to portability, usability, maintainability, scalability, performance, etc. To further optimize the performance of the software a meta optimization was implemented to find ideal parameters for the global optimization algorithm. Furthermore a new model for intermediate layers was implemented, to allow sample models with a continuous transition between layers. To test the new software, comparison evaluations for different measurements were made.
Keywords: GIXRF /
GIXRF; GEXRF; Ultra thin layer analysis; modelling&simulation
URI: https://resolver.obvsg.at/urn:nbn:at:at-ubtuw:1-124841
Library ID: AC15361071
Organisation: E141 - Atominstitut 
Publication Type: Thesis
Appears in Collections:Thesis

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