ECS Meeting Abstracts

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Book details Buch-Details

Book title Buchtitel
ECS Meeting Abstracts
 
Publisher Herausgeber
ECS Transactions
 
Place of publishing Erscheinungsort
Pennington
 
Series Schriftenreihe
ECS Meeting Abstracts
 
Volume Band
33
 

Publications Publikationen

Results 1-8 of 8 (Search time: 0.002 seconds).

PreviewAuthor(s)TitleTypeIssue Date
1Palankovski, Vassil ; Kuzmik, J. A Promising New n++-GaN/InAlN/GaN HEMT Concept for High-Frequency ApplicationsKonferenzbeitrag Inproceedings2012
2Palankovski, Vassil ; Kuzmik, J. Degradation Study of Single and Double-Heterojunction InAlN/GaN HEMTs by Two-Dimensional SimulationKonferenzbeitrag Inproceedings2012
3Knobloch, Theresia ; Grasser, Tibor Gate Stack Design for Field-Effect Transistors Based on Two-Dimensional MaterialsInproceedings Konferenzbeitrag 28-May-2023
4Knobloch, Theresia ; Selberherr, Siegfried ; Grasser, Tibor High-Performance Field-Effect Transistors Based on Two-Dimensional Materials for VLSI CircuitsInproceedings Konferenzbeitrag28-May-2023
5Fiorentini, Simone ; Lacerda de Orio, Roberto ; Selberherr, Siegfried ; Ender, Johannes ; Goes, Wolfgang ; Sverdlov, Viktor Influence of Current Redistribution in Switching Models for Perpendicular STT-MRAMKonferenzbeitrag Inproceedings 2020
6Illarionov, Yury Yuryevich ; Knobloch, Theresia ; Grasser, Tibor (Invited) Where Are the Best Insulators for 2D Field-Effect Transistors?Konferenzbeitrag Inproceedings2020
7Franco, J. ; Kaczer, Ben ; Mitard, J. ; Toledano-Luque, M. ; Eneman, G. ; Roussel, Ph. J. ; Cho, M. ; Kauerauf, T. ; Grasser, Tibor ; Witters, L. ; Hellings, Geert ; Ragnarsson, L. A. ; Horiguchi, N. ; Heyns, Marc M. ; Groeseneken, G. Reliability of SiGe Channel MOSKonferenzbeitrag Inproceedings2012
8Hollauer, Christian ; Ceric, Hajdin ; Selberherr, Siegfried Three-Dimensional Simulation of Thermal Oxidation and the Influence of StressBuchbeitrag Book Contribution2005