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| | Preview | Author(s) | Title | Type | Issue Date |
| 1 | | Grasser, Tibor ; Goes, Wolfgang ; Kaczer, Ben | Critical Modeling Issues in Negative Bias Temperature Instability | Buchbeitrag Book Contribution | 2009 |
| 2 | | Goes, Wolfgang ; Schanovsky, Franz ; Hehenberger, Philipp ; Wagner, Paul-Juergen ; Grasser, Tibor | (Invited) Charge Trapping and the Negative Bias Temperature Instability | Buchbeitrag Book Contribution | 2010 |
| 3 | | Knobloch, Theresia ; Rzepa, Gerhard ; Illarionov, Yury Yuryevich ; Waltl, Michael ; Polyushkin, Dmitry ; Pospischil, Andreas ; Furchi, Marco ; Mueller, Thomas ; Grasser, Tibor | (Invited) Impact of Gate Dielectrics on the Threshold Voltage in MoS<sub>2</sub>Transistors | Buchbeitrag Book Contribution | 2017 |
| 4 | | Goes, Wolfgang ; Toledano-Luque, Maria ; Schanovsky, Franz ; Bina, Markus ; Baumgartner, Oskar ; Kaczer, Ben ; Grasser, Tibor | (Invited) Multiphonon Processes as the Origin of Reliability Issues | Konferenzbeitrag Inproceedings | 2013 |
| 5 | | Tyaginov, Stanislav E. ; Starkov, Ivan ; Enichlmair, Hubert ; Park, Jong Mun ; Jungemann, Christoph ; Grasser, Tibor | Physics-Based Hot-Carrier Degradation Modeling | Buchbeitrag Book Contribution | 2011 |
| 6 | | Wagner, Martin ; Span, Gerhard ; Holzer, Stefan ; Palankovski, Vassil ; Triebl, Oliver ; Grasser, Tibor | Power Output Improvement of Silicon-Germanium Thermoelectric Generators | Buchbeitrag Book Contribution | 2006 |
| 7 | | Kaczer, Ben ; Grasser, Tibor ; Fernandez, Raul ; Groeseneken, Guido | Toward Understanding the Wide Distribution of Time Scales in Negative Bias Temperature Instability | Buchbeitrag Book Contribution | 2007 |
