2008 International Conference on Simulation of Semiconductor Processes and Devices

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2008 International Conference on Simulation of Semiconductor Processes and Devices
 

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PreviewAuthors / EditorsTitleTypeIssue Date
1Stimpfl, Franz ; Heinzl, Rene ; Schwaha, Philipp A robust parallel delaunay mesh generation approach suitable for three-dimensional TCADKonferenzbeitrag Inproceedings2008
2Lacerda de Orio, Roberto ; Ceric, Hajdin Analysis of electromigration in redundant viasKonferenzbeitrag Inproceedings2008
3Cervenka, Johann ; Selberherr, Siegfried Analysis of microstructure impact on electromigrationKonferenzbeitrag Inproceedings2008
4Vasicek, Martin ; Cervenka, Johann ; Karner, Markus ; Grasser, Tibor Consistent higher-order transport models for SOI MOSFETsKonferenzbeitrag Inproceedings2008
5Baumgartner, O. ; Schwaha, P. ; Karner, M. Coupling of non-equilibrium Green’s function and Wigner function approachesKonferenzbeitrag Inproceedings2008
6Goes, Wolfgang ; Karner, Markus ; Tyaginov, Stansilav ; Hehenberger, Philipp ; Grasser, Tibor Level shifts and gate interfaces as vital ingredients in modeling of charge trappingKonferenzbeitrag Inproceedings2008
7Windbacher, Thomas ; Selberherr, Siegfried Mobility enhancement in thin silicon films: Strain and thickness dependences of the effective masses and non-parabolicity parameterKonferenzbeitrag Inproceedings2008
8Grasser, Tibor ; Goes, Wolfgang ; Kaczer, Ben Modeling bias temperature instability during stress and recoveryKonferenzbeitrag Inproceedings2008
9Baumgartner, O. ; Karner, M. ; Kosina, H. Modeling of high-k-Metal-Gate-stacks using the non-equilibrium Green’s function formalismKonferenzbeitrag Inproceedings2008
10Numerical study of carbon nanotube infra-red photo-detectorsKonferenzbeitrag Inproceedings2008
11Windbacher, Thomas ; Sverdlov, Viktor ; Selberherr, Siegfried ; Heitzinger, Clemens ; Mauser, Norbert ; Ringhofer, Christian Simulation of field-effect Biosensors (BioFETs)Konferenzbeitrag Inproceedings2008
12Ertl, Otmar ; Selberherr, Siegfried Three-dimensional topography simulation using advanced level set and ray tracing methodsKonferenzbeitrag Inproceedings2008