Proceedings of the 17#^{th} International Symposium on the Physical & Failure Analysis of Integrated Circuits

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	Authors / Editors	Title	Type	Issue Date
1	Starkov, Ivan ; Tyaginov, S. E. ; Triebl, Oliver ; Cervenka, Johann ; Jungemann, C. ; Carniello, Sara ; Park, Jong Mun ; Enichlmair, H. ; Karner, Markus ; Kernstock, Christian ; Seebacher, E. ; Minixhofer, R. ; Ceric, Hajdin ; Grasser, Tibor	Analysis of Worst-Case Hot-Carrier Conditions for High Voltage Transistors Based on Full-Band Monte-Carlo Simulations	Konferenzbeitrag Inproceedings	2010
2	Huang, R ; Robl, W. ; Dehm, G. ; Ceric, Hajdin ; Detzel, T.	Disparate Tendency of Stress Evolution of Thin and Thick Electroplated Cu Films at Room Temperature	Konferenzbeitrag Inproceedings	2010
3	Ceric, Hajdin ; Orio, Roberto ; Selberherr, Siegfried	Electromigration Anisotropy and Mechanical Stress in Modern Copper Interconnect	Konferenzbeitrag Inproceedings	2010
4	Tyaginov, S. E. ; Starkov, Ivan ; Triebl, Oliver ; Cervenka, Johann ; Jungemann, C. ; Carniello, Sara ; Park, Jong Mun ; Enichlmair, H. ; Karner, Markus ; Kernstock, Christian ; Seebacher, E. ; Minixhofer, R. ; Ceric, Hajdin ; Grasser, Tibor	Hot-Carrier Degradation Modeling Using Full-Band Monte-Carlo Simulations	Konferenzbeitrag Inproceedings	2010
5	Wagner, Paul-Jürgen ; Grasser, Tibor ; Reisinger, H. ; Kaczer, Ben	Oxide Traps in MOS Transistors: Semi-Automatic Extraction of Trap Parameters from Time Dependent Defect Spectroscopy	Konferenzbeitrag Inproceedings	2010