EUROSOI-ULIS 2015: 2015 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon
Book title Buchtitel
EUROSOI-ULIS 2015: 2015 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon
Publisher Herausgeber
IEEE
Results 1-3 of 3 (Search time: 0.001 seconds).
| Preview | Authors / Editors | Title | Type | Issue Date | |
|---|---|---|---|---|---|
| 1 | Sharma, Prateek ; Tyaginov, Stanislav ; Wimmer, Yannick ; Rudolf, Florian ; Enichlmair, Hubert ; Park, Jong-Mun ; Ceric, Hajdin ; Grasser, Tibor | A model for hot-carrier degradation in nLDMOS transistors based on the exact solution of the Boltzmann transport equation versus the drift-diffusion scheme | Konferenzbeitrag Inproceedings | 2015 | |
| 2 | Ghosh, J. ; Osintsev, D. ; Sverdlov, V. ; Selberherr, S. | Dependence of spin lifetime on spin injection orientation in strained silicon films | Konferenzbeitrag Inproceedings | 2015 | |
| 3 | Illarionov, Yury ; Waltl, Michael ; Smith, A.D. ; Vaziri, S. ; Ostling, M. ; Lemme, M.C. ; Grasser, Tibor | Impact of hot carrier stress on the defect density and mobility in double-gated graphene field-effect transistors | Konferenzbeitrag Inproceedings | 2015 |