2017 IEEE International Reliability Physics Symposium (IRPS)
Book title Buchtitel
2017 IEEE International Reliability Physics Symposium (IRPS)
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| Preview | Authors / Editors | Title | Type | Issue Date | |
|---|---|---|---|---|---|
| 1 | Grill, A. ; Stampfer, B. ; Waltl, M. ; Im, Ki-Sik ; Lee, J.-H. ; Ostermaier, C. ; Ceric, H. ; Grasser, T. | Characterization and modeling of single defects in GaN/AlGaN fin-MIS-HEMTs | Konferenzbeitrag Inproceedings  | 2017 | |
| 2 | Illarionov, Yury ; Waltl, Michael ; Jech, Markus ; Kim, J.-S. ; Akinwande, D. ; Grasser, Tibor | Reliability of black phosphorus field-effect transistors with respect to bias-temperature and hot-carrier stress | Konferenzbeitrag Inproceedings | 2017 | |
| 3 | Ullmann, B. ; Jech, M. ; Tyaginov, S. ; Waltl, M. ; Illarionov, Y. ; Grill, A. ; Puschkarsky, K. ; Reisinger, H. ; Grasser, T. | The impact of mixed negative bias temperature instability and hot carrier stress on single oxide defects | Konferenzbeitrag Inproceedings | 2017 |