2017 IEEE International Reliability Physics Symposium (IRPS)

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2017 IEEE International Reliability Physics Symposium (IRPS)
 

Publications Publikationen

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PreviewAuthor(s)TitleTypeIssue Date
1Grill, A. ; Stampfer, B. ; Waltl, M. ; Im, Ki-Sik ; Lee, J.-H. ; Ostermaier, C. ; Ceric, H. ; Grasser, T. Characterization and modeling of single defects in GaN/AlGaN fin-MIS-HEMTsKonferenzbeitrag Inproceedings 2017
2Illarionov, Yury ; Waltl, Michael ; Jech, Markus ; Kim, J.-S. ; Akinwande, D. ; Grasser, Tibor Reliability of black phosphorus field-effect transistors with respect to bias-temperature and hot-carrier stressKonferenzbeitrag Inproceedings 2017
3Ullmann, B. ; Jech, M. ; Tyaginov, S. ; Waltl, M. ; Illarionov, Y. ; Grill, A. ; Puschkarsky, K. ; Reisinger, H. ; Grasser, T. The impact of mixed negative bias temperature instability and hot carrier stress on single oxide defectsKonferenzbeitrag Inproceedings2017