2020 IEEE International Integrated Reliability Workshop (IIRW)
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2020 IEEE International Integrated Reliability Workshop (IIRW)
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| Preview | Authors / Editors | Title | Type | Issue Date | |
|---|---|---|---|---|---|
| 1 | Tselios, K. ; Stampfer, B. ; Michl, J. ; Ioannidis, E. ; Enichlmair, H. ; Waltl, M. | Distribution of Step Heights of Electron and Hole Traps in SiON nMOS Transistors | Konferenzbeitrag Inproceedings  | 2020 | |
| 2 | Vasilev, Alexander ; Jech, Markus ; Grill, Alexander ; Rzepa, Gerhard ; Schleich, Christian ; Makarov, Alexander ; Pobegen, Gregor ; Grasser, Tibor ; Waltl, Michael ; Tyaginov, Stanislav | Modeling the Hysteresis of Current-Voltage Characteristics in 4H-SiC Transistors | Konferenzbeitrag Inproceedings | 2020 |