Rzepa, Gerhard

Network Lab View Statistics Email Alert RSS Feed

Profile Profil

Full name Familienname, Vorname
Rzepa, Gerhard
 

Own Publications Eigene Publikationen

Results 1-5 of 5 (Search time: 0.003 seconds).

PreviewAuthors / EditorsTitleTypeIssue Date
1Waltl, Michael ; Waldhoer, Dominic ; Tselios, Konstantinos ; Stampfer, Bernhard ; Schleich, Christian ; Rzepa, Gerhard ; Enichlmair, Hubert ; Ioannidis, Eleftherios G. ; Minixhofer, Rainer ; Grasser, Tibor Impact of Single-Defects on the Variability of CMOS Inverter CircuitsArtikel Article 2021
2Vasilev, Alexander ; Jech, Markus ; Grill, Alexander ; Rzepa, Gerhard ; Schleich, Christian ; Makarov, Alexander ; Pobegen, Gregor ; Grasser, Tibor ; Waltl, Michael ; Tyaginov, Stanislav Modeling the Hysteresis of Current-Voltage Characteristics in 4H-SiC TransistorsKonferenzbeitrag Inproceedings 2020
3Jech, Markus ; Rott, Gunnar ; Reisinger, Hans ; Tyaginov, Stanislav ; Rzepa, Gerhard ; Grill, Alexander ; Jabs, Dominic ; Jungemann, Christoph ; Waltl, Michael ; Grasser, Tibor Mixed Hot-Carrier/Bias Temperature Instability Degradation Regimes in Full {VG, VD} Bias Space: Implications and PeculiaritiesArtikel Article 2020
4Waltl, Michael ; Stampfer, Bernhard ; Rzepa, Gerhard ; Kaczer, Ben ; Grasser, Tibor Separation of Electron and Hole Trapping Components of PBTI in SiON nMOS TransistorsArtikel Article 2020
5Scharlotta, Jean-Yean ; Bersuker, Gennadi ; Tyaginov, S. E. ; Young, Chadwing ; Haase, Gaddi ; Rzepa, Gerhard ; Waltl, Michael ; Chohan, Talha ; Iyer, Subramanian ; Kotov, Alexander ; Zambelli, Cristian ; Guarin, Fernando ; Puglisi, Francesco Maria ; Ostermaier, C IIRW 2019 Discussion Group II: Reliability for Aerospace ApplicationsKonferenzbeitrag Inproceedings2019

Contributing Publications Mitbeteiligte Publikationen

Results 1-1 of 1 (Search time: 0.003 seconds).

PreviewAuthors / EditorsTitleTypeIssue Date
1Knobloch Theresia - 2016 - Characterization and physical modeling of degradation...pdf.jpgKnobloch, Theresia Characterization and physical modeling of degradation in MoS2 transistorsThesis Hochschulschrift 2016