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| | Preview | Author(s) | Title | Type | Issue Date |
| 41 | | Tyaginov, S. E. ; Bina, Markus ; Franco, J. ; Osintsev, Dimitry ; Triebl, Oliver ; Kaczer, Ben ; Grasser, Tibor | Physical Modeling of Hot-Carrier Degradation for Short- and Long-channel MOSFETs | Konferenzbeitrag Inproceedings | 2014 |
| 42 | | Ryan, J. T. ; Lenahan, P. M. ; Grasser, Tibor ; Enichlmair, H. | Recovery-Free Electron Spin Resonance Observations of NBTI Degradation | Konferenzbeitrag Inproceedings | 2010 |
| 43 | | Franco, J. ; Kaczer, Ben ; Toledano-Luque, M. ; Roussel, Ph. J. ; Groeseneken, G. ; Schwarz, Benedikt ; Bina, Markus ; Waltl, Michael ; Wagner, Paul-Jürgen ; Grasser, Tibor | Reduction of the BTI Time-Dependent Variability in Nanoscaled MOSFETs by Body Bias | Konferenzbeitrag Inproceedings | 2013 |
| 44 | | Illarionov, Yury ; Waltl, Michael ; Jech, Markus ; Kim, J.-S. ; Akinwande, D. ; Grasser, Tibor | Reliability of black phosphorus field-effect transistors with respect to bias-temperature and hot-carrier stress | Konferenzbeitrag Inproceedings  | 2017 |
| 45 | | Toledano-Luque, M. ; Kaczer, Ben ; Roussel, Ph. J. ; Grasser, Tibor ; Wirth, G.I. ; Franco, J. ; Vrancken, C. ; Horiguchi, N. ; Groeseneken, G. | Response of a Single Trap to AC Negative Bias Temperature Stress | Konferenzbeitrag Inproceedings | 2011 |
| 46 | | Johnsson, David ; Mamanee, Wasinee ; Bychikhin, Sergey ; Pogany, Dionyz ; Gornik, Erich ; Stecher, Matthias | Second breakdown in bipolar ESD protection devices during low current long duration stress and its relation to moving current-tubes | Konferenzbeitrag Inproceedings | 2008 |
| 47 | | Grasser, Tibor ; Aichinger, T. ; Pobegen, G. ; Reisinger, H. ; Wagner, Paul-Jürgen ; Franco, J. ; Nelhiebel, M. ; Kaczer, Ben | The 'Permanent' Component of NBTI: Composition and Annealing | Konferenzbeitrag Inproceedings | 2011 |
| 48 | | Ullmann, B. ; Jech, M. ; Tyaginov, S. ; Waltl, M. ; Illarionov, Y. ; Grill, A. ; Puschkarsky, K. ; Reisinger, H. ; Grasser, T. | The impact of mixed negative bias temperature instability and hot carrier stress on single oxide defects | Konferenzbeitrag Inproceedings | 2017 |
| 49 | | Kaczer, Ben ; Franco, J. ; Toledano-Luque, M. ; Roussel, Ph. J. ; Bukhori, Muhammad Faiz ; Asenov, A ; Schwarz, Benedikt ; Bina, Markus ; Grasser, Tibor ; Groeseneken, G. | The Relevance of Deeply-Scaled FET Threshold Voltage Shifts for Operation Lifetimes | Konferenzbeitrag Inproceedings | 2012 |
| 50 | | Reisinger, H. ; Grasser, Tibor ; Schlunder, C. ; Gustin, W. | The Statistical Analysis of Individual Defects constituting NBTI and its Implications for Modeling DC- and AC-Stress | Konferenzbeitrag Inproceedings | 2010 |
| 51 | | Grasser, Tibor ; Reisinger, H. ; Wagner, P. ; Kaczer, Ben ; Schanovsky, Franz ; Gös, Wolfgang | The Time Dependent Defect Spectroscopy (TDDS) for the Characterization of the Bias Temperature Instability | Konferenzbeitrag Inproceedings | 2010 |
| 52 | | Grasser, Tibor ; Gös, Wolfgang ; Sverdlov, Viktor ; Kaczer, Ben | The Universality of NBTI Relaxation and its Implications for Modeling and Characterization | Konferenzbeitrag Inproceedings | 2007 |
| 53 | | Grasser, T. ; Waltl, M. ; Rzepa, G. ; Goes, W. ; Wimmer, Y. ; El-Sayed, A.-M. ; Shluger, A. L. ; Reisinger, H. ; Kaczer, B. | The “permanent” component of NBTI revisited: Saturation, degradation-reversal, and annealing | Konferenzbeitrag Inproceedings | 2016 |
| 54 | | Lagger, Peter Willibald ; Donsa, Stefan ; Spreitzer, P. ; Pobegen, G. ; Reiner, Maria ; Naharashi, H. ; Mohamed, J. ; Mösslacher, M. ; Prechtl, G. ; Pogany, Dionyz ; Ostermaier, C | Thermal activation of PBTI-related stress and recovery processes in GaN MIS-HEMTs using on-wafer heaters | Konferenzbeitrag Inproceedings | 2015 |
| 55 | | Esmark, Kai ; Gossner, Harald ; Bychikhin, Sergey ; Pogany, Dionyz ; Russ, C ; Langguth, G. ; Gornik, Erich | Transient behaviour of SCRs under ESD pulses | Konferenzbeitrag Inproceedings | 2008 |
| 56 | | Kaczer, Ben ; Grasser, Tibor ; Roussel, Ph. J. ; Martin-Martinez, J. ; O´Connor, R. ; O´Sullivan, B. J. ; Groeseneken, G. | Ubiquitous Relaxation in BTI Stressing-New Evaluation and Insights | Konferenzbeitrag Inproceedings | 2008 |
| 57 | | Aichinger, T. ; Nelhiebel, M. ; Grasser, Tibor | Unambiguous Identification of the NBTI Recovery Mechanism using Ultra-Fast Temperature Changes | Konferenzbeitrag Inproceedings | 2009 |
| 58 | | Reisinger, H. ; Grasser, Tibor ; Ermisch, K. ; Nielen, H. ; Gustin, W. ; Schlünder, C. | Understanding and Modeling AC BTI | Konferenzbeitrag Inproceedings | 2011 |
