Notice
This item was automatically migrated from a legacy system. It's data has not been checked and might not meet the quality criteria of the present system.
Record link: 
http://hdl.handle.net/20.500.12708/70798
-
Title: 
Unambiguous Identification of the NBTI Recovery Mechanism using Ultra-Fast Temperature Changes
-
Citation: 
Aichinger, T., Nelhiebel, M., & Grasser, T. (2009). Unambiguous Identification of the NBTI Recovery Mechanism using Ultra-Fast Temperature Changes. In Proceedings of the IEEE International Reliability Physics Symposium (IRPS) (pp. 2–7). http://hdl.handle.net/20.500.12708/70798
-
Publication Type: 
Inproceedings - Full-Paper Contribution
en
Authors: 
Aichinger, T. 
Nelhiebel, M. 
Grasser, Tibor 
-
Organisational Unit: 
E360 - Institut für Mikroelektronik 
-
Published in: 
Proceedings of the IEEE International Reliability Physics Symposium (IRPS) 
-
Date (published): 
2009
-
Event name: 
International Reliability Physics Symposium (IRPS) 
-
Event date: 
15-Apr-2007 - 19-Apr-2007
-
Event place: 
Phoenix, Non-EU
-
Number of Pages: 
6
-
Peer reviewed: 
No
-
Science Branch: 
Elektrotechnik, Elektronik
-
Appears in Collections:
Conference Paper

Show full item record

Page view(s)

148
checked on Dec 1, 2023

Google ScholarTM

Check