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PreviewAuthor(s)TitleTypeIssue Date
1Wieland, D. ; Ofner, S. ; Stabentheiner, Manuel ; Butej, Boris ; Koller, C. ; Sun, J. ; Minetto, A ; Reiser, K. ; Häberlen, O. ; Nelhiebel, M. ; Glavanovics, M ; Pogany, D. ; Ostermaier, C A common hard-failure mechanism in GaN HEMTs in accelerated switching and single-pulse short-circuit testsInproceedings Konferenzbeitrag2023
2Saleh, Ahmed S. ; Zahedmanesh, Houman ; Ceric, Hajdin ; De Wolf, Ingrid ; Croes, Kristof Impact of via geometry and line extension on via-electromigration in nano-interconnectsInproceedings Konferenzbeitrag2023
3Bogner, Christian ; Schlunder, Christian ; Waltl, Michael ; Reisinger, Hans ; Grasser, Tibor Modeling of NBTI Induced Threshold Voltage Shift Based on Activation Energy Maps Under Consideration of VariabilityInproceedings Konferenzbeitrag 15-Mar-2023