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Starkov, Ivan
 

Own Publications Eigene Publikationen

Results 1-20 of 37 (Search time: 0.001 seconds).

PreviewAuthor(s)TitleTypeIssue Date
1Starkov, Ivan ; Enichlmair, Hubert Local Oxide Capacitance as a Crucial Parameter for Characterization of Hot-Carrier Degradation in Long-Channel n-MOSFETsArtikel Article2013
2Starkov Ivan - 2013 - Comprehensive physical modeling of hot-carrier induced...pdf.jpgStarkov, Ivan Comprehensive physical modeling of hot-carrier induced degradationThesis Hochschulschrift 2013
3Starkov, Alexander ; Pakhomov, Oleg ; Starkov, Ivan ; Zaitsev, A. ; Baranov, I. Principles of Solid-State Cooler on Layered MultiferroicsKonferenzbeitrag Inproceedings2012
4Starkov, Alexander ; Pakhomov, Oleg ; Starkov, Ivan Account for Mutual Influence of Electrical, Elastic and Thermal Phenomena for Ferroelectric Domain Wall ModelingKonferenzbeitrag Inproceedings2012
5Starkov, Alexander ; Baranov, I. ; Pakhomov, Oleg ; Starkov, Ivan ; Zaitsev, A. Principles of Solid-State Cooler on Layered MultiferroicsKonferenzbeitrag Inproceedings2012
6Starkov, Alexander ; Starkov, Ivan Domain-Wall Motion for Slowly Varying Electric FieldKonferenzbeitrag Inproceedings2012
7Starkov, Alexander ; Pakhomov, Oleg ; Starkov, Ivan Thermodynamic Foundations of Solid-State Cooler Based on Multiferroic MaterialsKonferenzbeitrag Inproceedings2012
8Starkov, Ivan ; Enichlmair, H. ; Grasser, Tibor Local Oxide Capacitance as a Crucial Parameter for Characterization of Hot-Carrier Degradation in High-Voltage n-MOSFETKonferenzbeitrag Inproceedings2012
9Semenov, Alexander ; Dedyk, A. I. ; Belavsky, P. Y. ; Pavlova, Yu. V. ; Karmanenko, Sergey ; Pakhomov, Oleg ; Starkov, Alexander ; Starkov, Ivan A Study of Ferroelectric Multilayer Structures Based on BST Films Containing High Concentration of Magnetic IonsKonferenzbeitrag Inproceedings2012
10Dedyk, A. I. ; Pavlova, Yu. V. ; Semenov, Alexander ; Pakhomov, Oleg ; Starkov, Alexander ; Starkov, Ivan ; Beliavskiy, P. Yu. The influence “heating-cooling” process rate on temperature hysteresis of ferroelectric capasitor structuresKonferenzbeitrag Inproceedings2012
11Starkov, Alexander ; Starkov, Ivan Theoretical model of SPM-tip electrostatic field accounting for dead layer and domain wallKonferenzbeitrag Inproceedings2012
12Starkov, Ivan ; Enichlmair, H. ; Tyaginov, S. E. ; Grasser, Tibor Analysis of the Threshold Voltage Turn-Around Effect in High-Voltage n-MOSFETs Due to Hot-Carrier StressKonferenzbeitrag Inproceedings2012
13Starkov, Alexander ; Pakhomov, Oleg ; Starkov, Ivan Impact of the Pyroelectric Effect on Ferroelectric Phase TransitionsArtikel Article2012
14Starkov, Alexander ; Pakhomov, Oleg ; Starkov, Ivan Solid-State Cooler: New OpportunitiesArtikel Article2012
15Starkov, Ivan ; Tyaginov, Stanislav ; Enichlmair, Hubert ; Park, Jong Mun ; Ceric, Hajdin ; Grasser, Tibor Accurate Extraction of MOSFET Unstressed Interface State Spatial Distribution from Charge Pumping MeasurementsArtikel Article2011
16Dedyk, Antonina ; Pavlova, Yulia ; Karmanenko, Sergey ; Semenov, Alexander ; Semikin, Dmitry ; Pakhomov, Oleg ; Starkov, Alexander ; Starkov, Ivan Temperature Hysteresis of the Capacitance Dependence C(T) for Ferroelectric CeramicsArtikel Article2011
17Starkov, Ivan ; Ceric, Hajdin Impact of Interface State Density on MOSFET Local Oxide Capacitance Degradation During Hot-Carrier StressKonferenzbeitrag Inproceedings2011
18Tyaginov, S. E. ; Starkov, Ivan ; Jungemann, C. ; Enichlmair, H. ; Park, Jong Mun ; Grasser, Tibor Impact of the Carrier Distribution Function on Hot-Carrier Degradation ModelingKonferenzbeitrag Inproceedings2011
19Starkov, Alexander ; Pakhomov, Oleg ; Starkov, Ivan Physical Model for Ferroelectrics Based on Pyrocurrent ConsiderationPräsentation Presentation2011
20Starkov, Alexander ; Pakhomov, Oleg ; Starkov, Ivan Solid-State Cooler - New OpportunitiesPräsentation Presentation2011