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Record link: 
http://hdl.handle.net/20.500.12708/72282
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Title: 
Impact of the Carrier Distribution Function on Hot-Carrier Degradation Modeling
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Citation: 
Tyaginov, S. E., Starkov, I., Jungemann, C., Enichlmair, H., Park, J. M., & Grasser, T. (2011). Impact of the Carrier Distribution Function on Hot-Carrier Degradation Modeling. In Proceedings of the European Solid-State Device Research Conference (ESSDERC) (pp. 151–154). http://hdl.handle.net/20.500.12708/72282
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Publication Type: 
Inproceedings - Full-Paper Contribution
en
Authors: 
Tyaginov, S. E. 
Starkov, Ivan 
Jungemann, C. 
Enichlmair, H. 
Park, Jong Mun 
Grasser, Tibor 
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Organisational Unit: 
E360 - Institut für Mikroelektronik 
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Published in: 
Proceedings of the European Solid-State Device Research Conference (ESSDERC) 
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Date (published): 
2011
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Event name: 
European Solid-State Device Research Conference (ESSDERC) 
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Event date: 
16-Sep-1991 - 19-Sep-1991
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Event place: 
Montreux, Austria
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Number of Pages: 
4
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Peer reviewed: 
No
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Science Branch: 
Elektrotechnik, Elektronik
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Appears in Collections:
Conference Paper

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