Full name Familienname, Vorname
Reiter, Tobias
 
Main Affiliation Organisations­zuordnung
 

Results 1-18 of 18 (Search time: 0.001 seconds).

PreviewAuthor(s)TitleTypeIssue Date
1Reiter-2023-Solid-State Electronics-vor.pdf.jpgReiter, Tobias ; Aguinsky, Luiz Felipe ; Souza Berti Rodrigues, Francio ; Weinbub, Josef ; Hössinger, Andreas ; Filipovic, Lado Modeling the Impact of Incomplete Conformality During Atomic Layer ProcessingArticle Artikel Jan-2024
2Filipovic, Lado ; Bobinac, Josip ; Piso, Julius ; Reiter, Tobias Physics-Informed Compact Model for SF6/O2 Plasma EtchingInproceedings Konferenzbeitrag20-Nov-2023
3Reiter, Tobias ; Toifl, Alexander ; Hössinger, Andreas ; Filipovic, Lado Modeling Oxide Regrowth During Selective Etching in Vertical 3D NAND StructuresInproceedings Konferenzbeitrag20-Nov-2023
4Reiter, Tobias ; Filipovic, Lado Fast 3D Flux Calculation using Monte Carlo Ray Tracing on GPUsInproceedings Konferenzbeitrag 20-Sep-2023
5Horodynski, Michael ; Reiter, Tobias ; Kühmayer, Matthias ; Rotter, Stefan Tractor beams with optimal pulling force using structured wavesArticle Artikel 4-Aug-2023
6Kersten-2023-Physical Review Letters-vor.pdf.jpgKersten, Wenzel Nikolaus ; De Zordo, Nikolaus ; Diekmann, Oliver ; Reiter, Tobias ; Zens, Matthias ; Kanagin, Andrew Niels ; Rotter, Stefan ; Schmiedmayer, Hannes-Jörg ; Angerer, Andreas Triggered Superradiance and Spin Inversion Storage in a Hybrid Quantum SystemArticle Artikel 28-Jul-2023
7Filipovic, Lado ; Reiter, Tobias ; Klemenschits, Xaver ; Leroch, Sabine ; Stella, Robert ; Baumgartner, Oskar ; Hössinger, Andreas Process Simulation in Micro- and Nano-ElectronicsInproceedings Konferenzbeitrag 12-Jun-2023
8Bobinac, Josip ; Reiter, Tobias ; Piso, Julius ; Klemenschits, Xaver ; Baumgartner, Oskar ; Stanojevic, Zlatan ; Strof, Georg ; Karner, Markus ; Filipovic, Lado Effect of Mask Geometry Variation on Plasma Etching ProfilesArticle Artikel 16-Mar-2023
9Bobinac-2023-Micromachines-vor.pdf.jpgBobinac, Josip ; Reiter, Tobias ; Piso, Julius ; Klemenschits, Xaver ; Baumgartner, Oskar ; Stanojevic, Zlatan ; Strof, Georg ; Karner, Markus ; Filipovic, Lado Effect of Mask Geometry Variation on Plasma Etching ProfilesArticle Artikel 16-Mar-2023
10Aguinsky-2023-Solid-State Electronics-vor.pdf.jpgAguinsky, Luiz Felipe ; Souza Berti Rodrigues, Francio ; Reiter, Tobias ; Klemenschits, Xaver ; Filipovic, Lado ; Hössinger, Andreas ; Weinbub, Josef Modeling Incomplete Conformality During Atomic Layer Deposition in High Aspect Ratio StructuresArticle Artikel Mar-2023
11Filipovic, Lado ; Baumgartner, Oskar ; Klemenschits, Xaver ; Piso, Julius ; Bobinac, Josip ; Reiter, Tobias ; Strof, Georg ; Rzepa, Gerhard ; Stanojevic, Zlatan ; Karner, Markus DTCO flow for air spacer generation and its impact on power and performance at N7Article Artikel Jan-2023
12Reiter, Tobias ; Klemenschits, Xaver ; Filipovic, Lado Modeling Plasma-Induced Damage During the Dry Etching of SiliconInproceedings Konferenzbeitrag9-Oct-2022
13Reiter, Tobias ; Klemenschits, Xaver ; Filipovic, Lado Impact of Plasma Induced Damage on the Fabrication of 3D NAND Flash MemoryArtikel Article 2022
14Bobinac, Josip ; Reiter, Tobias ; Piso, Julius ; Klemenschits, Xaver ; Baumgartner, O ; Stanojevic, Zlatan ; Strof, G ; Karner, M ; Filipovic, Lado Impact of Mask Tapering on SF6/O2 Plasma EtchingKonferenzbeitrag Inproceedings 2022
15Filipovic, Lado ; Baumgartner, Oskar ; Piso, Julius ; Bobinac, Josip ; Reiter, Tobias ; Strof, G ; Rzepa, Gerhard ; Stanojevic, Zlatan ; Karner, Markus DTCO Flow for Air Spacer Generation and its Impact on Power and Performance at N7Konferenzbeitrag Inproceedings 2022
16Reiter Tobias - 2022 - Stabilization of spin ensembles in hybrid quantum systems.pdf.jpgReiter, Tobias Stabilization of spin ensembles in hybrid quantum systemsThesis Hochschulschrift 2022
17Reiter, Tobias ; Klemenschits, Xaver ; Filipovic, Lado Impact of High-Aspect-Ratio Etching Damage on Selective Epitaxial Silicon Growth in 3D NAND Flash MemoryKonferenzbeitrag Inproceedings 2021
18Reiter, Tobias ; Klemenschits, Xaver ; Filipovic, Lado Impact of High-Aspect-Ratio Etching Damage on Selective Epitaxial Silicon Growth in 3D NAND Flash MemoryKonferenzbeitrag Inproceedings2021