|
| | Preview | Authors / Editors | Title | Type | Issue Date |
| 1 | | Brezna, Wolfgang ; Harasek, S. ; Lugstein, Alois ; Leitner, Thomas ; Hoffmann, Helmuth ; Bertagnolli, Emmerich ; Smoliner, Jürgen | Mapping of local oxide properties by quantitative scanning capacitance spectroscopy | Artikel Article | 2005 |
| 2 | | Harasek, S. ; Abermann, Stephan ; Brezna, Wolfgang ; Smoliner, Jürgen ; Bertagnolli, Emmerich | MOCVD of zirconium-oxide thin films for High-K dielectrica | Präsentation Presentation | 2005 |
| 3 | | Schröder, A. ; Harasek, S. ; Kupnik, Mario ; Wiesinger, Michael ; Gornik, Erich ; Benes, Ewald ; Gröschl, Martin | A Capacitance Ultrasonic Transducer for High-Temperature Applications | Artikel Article | 2004 |
| 4 | | Brezna, Wolfgang ; Schramböck, Matthias ; Lugstein, Alois ; Harasek, S. ; Enichlmair, H. ; Bertagnolli, Emmerich ; Gornik, Erich ; Smoliner, Jürgen | Quantitative Scanning Capacitance Sppecroscopy | Präsentation Presentation | 2004 |
| 5 | | Brezna, Wolfgang ; Harasek, S. ; Lugstein, Alois ; Leitner, Thomas ; Hoffmann, Helmuth ; Bertagnolli, Emmerich ; Smoliner, Jürgen | Quantitative Scanning Capacitanc Spectroscopy | Präsentation Presentation | 2004 |
| 6 | | Wanzenböck, Heinz D. ; Harasek, S. ; Langfischer, Helmut ; Auer, Erwin ; Bertagnolli, Emmerich ; Hutter, Herbert ; Störi, Herbert | Focused Ion Beam induced Chemical Vapor Deposition (FIB-DVD) for Local Nanodeposition of Dielectric Material | Präsentation Presentation | 2003 |
| 7 | | Langfischer, Helmut ; Harasek, S. ; Wanzenböck, Heinz D. ; Lugstein, Alois ; Basnar, B. ; Bertagnolli, Emmerich | Morphological Studies of Focused Ion Beam Induced Tungsten Deposition | Präsentation Presentation | 2003 |
| 8 | | Wanzenböck, Heinz D. ; Harasek, S. ; Langfischer, Helmut ; Brezna, Wolfgang ; Smoliner, Jürgen ; Bertagnolli, Emmerich | Deposition Mechanism of oxide thin films manufactured by a focused energetic beam process | Präsentation Presentation | 2002 |
| 9 | | Wanzenböck, Heinz D. ; Hobler, Gerhard ; Langfischer, Helmut ; Harasek, S. ; Brezna, Wolfgang ; Smoliner, Jürgen ; Bertagnolli, Emmerich | Characterization of Doping and intermixing effects of focused ion beam processing | Präsentation Presentation | 2002 |
| 10 | | Wanzenböck, Heinz D. ; Langfischer, Helmut ; Harasek, S. ; Bertagnolli, Emmerich | Versatile Nanodeposition of Dielectrics and Metals by noncontract direct-write technologies | Präsentation Presentation | 2002 |
| 11 | | Harasek, S. ; Wanzenböck, Heinz D. ; Langfischer, Helmut ; Bertagnolli, Emmerich | Ultrathin zirconium dioxide chemically deposited at a low thermal budget | Präsentation Presentation | 2002 |
| 12 | | Wanzenböck, Heinz D. ; Gergov, S. ; Auer, Erwin ; Harasek, S. ; Bertagnolli, Emmerich ; Gritsch, Martin ; Hutter, Herbert ; Brenner, Josef ; Störi, Herbert | Reliability of Silicon Oxide deposited by an Focused Ion Beam as Insulator for Microelectronic Interconnect Layer | Präsentation Presentation | 2001 |
| 13 | | Wanzenböck, Heinz D. ; Lugstein, Alois ; Harasek, S. ; Langfischer, Helmut ; Bertagnolli, Emmerich | Advances in Material Porperties of Focused Ion Beam Deposited Dielectics | Präsentation Presentation | 2000 |
