Record link: 
http://hdl.handle.net/20.500.12708/140572
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Title: 
Refitting an X-ray diffraction system for combined GIXRF and XRR measurements
en
Citation: 
Ingerle, D., Artner, W., Hradil, K., & Streli, C. (2020). Refitting an X-ray diffraction system for combined GIXRF and XRR measurements. Powder Diffraction, 35(S1), S29–S33. https://doi.org/10.1017/s088571562000041x
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Publisher DOI: 
10.1017/s088571562000041x
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Publication Type: 
Article - Original Research Article
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Language: 
English
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Authors: 
Ingerle, Dieter 
Artner, Werner 
Hradil, Klaudia 
Streli, Christina 
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Organisational Unit: 
E141-05 - Forschungsbereich Radiation Physics 
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Journal: 
Powder Diffraction 
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ISSN: 
0885-7156
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Date (published): 
2020
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Number of Pages: 
5
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Publisher: 
CAMBRIDGE UNIV PRESS
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Peer reviewed: 
Yes
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Keywords: 
Condensed Matter Physics; General Materials Science; Instrumentation; Radiation
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Research Areas: 
Special and Engineering Materials: 100%
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Science Branch: 
Physik, Astronomie
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