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Record link:
http://hdl.handle.net/20.500.12708/146276
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Title:
Can Dark Silicon Be Exploited to Prolong System Lifetime?
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Citation:
Haghbayan, M.-H., Rahmani, A.-M., Liljeberg, P., Jantsch, A., Miele, A., Bolchini, C., & Tenhunen, H. (2017). Can Dark Silicon Be Exploited to Prolong System Lifetime?
IEEE Design and Test
,
34
(2), 51–59. https://doi.org/10.1109/mdat.2016.2630317
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Publisher DOI:
10.1109/mdat.2016.2630317
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Publication Type:
Article - Original Research Article
en
Language:
English
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Authors:
Haghbayan, Mohammad-Hashem
Rahmani, Amir-Mohammad
Liljeberg, Pasi
Jantsch, Axel
Miele, Antonio
Bolchini, Christiana
Tenhunen, Hannu
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Organisational Unit:
E384-02 - Forschungsbereich Systems on Chip
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Journal:
IEEE Design and Test
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ISSN:
2168-2356
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Date (published):
2017
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Number of Pages:
9
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Publisher:
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
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Peer reviewed:
Yes
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Keywords:
Electrical and Electronic Engineering; Software; Hardware and Architecture
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Research Areas:
Computer Engineering and Software-Intensive Systems: 100%
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Science Branch:
Elektrotechnik, Elektronik, Informationstechnik
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Appears in Collections:
Article
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