Record link: 
http://hdl.handle.net/20.500.12708/147133
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Title: 
Influence of Substrate Tilt Angle on the Incorporation of BaHfO3 in Thick YBa2Cu3O7-δ Films
en
Citation: 
Sieger, M., Pahlke, P., Ottolinger, R., Stafford, B. H., Lao, M., Meledin, A., Bauer, M., Eisterer, M., Van Tendeloo, G., Schultz, L., Nielsch, K., & Hühne, R. (2017). Influence of Substrate Tilt Angle on the Incorporation of BaHfO3 in Thick YBa2Cu3O7-δ Films. IEEE Transactions on Applied Superconductivity, 27(4). https://doi.org/10.1109/tasc.2016.2631587
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Publisher DOI: 
10.1109/tasc.2016.2631587
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Publication Type: 
Article - Original Research Article
en
Language: 
English
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Authors: 
Sieger, M. 
Pahlke, Patrick 
Ottolinger, Rick 
Stafford, B. H. 
Lao, Mayraluna 
Meledin, A. 
Bauer, M. 
Eisterer, Michael 
Van Tendeloo, Gustaaf 
Schultz, L. 
Nielsch, Kornelius 
Hühne, R. 
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Organisational Unit: 
E141-06 - Forschungsbereich Low Temperature Physics and Superconductivity 
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Journal: 
IEEE Transactions on Applied Superconductivity 
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ISSN: 
1051-8223
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Date (published): 
Jun-2017
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Number of Pages: 
4
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Publisher: 
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
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Peer reviewed: 
Yes
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Keywords: 
Electrical and Electronic Engineering; Condensed Matter Physics; Electronic, Optical and Magnetic Materials
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Research Areas: 
Structure-Property Relationship: 100%
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Science Branch: 
Physik, Astronomie
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