Bilo, F., Borgese, L., Prost, J., Rauwolf, M., Turyanskaya, A., Wobrauschek, P., Kregsamer, P., Streli, C., Pazzaglia, U., & Depero, L. E. (2015). Atomic layer deposition to prevent metal transfer from implants: an X-Ray Fluorescence study. Applied Surface Science, 359, 215–220. https://doi.org/10.1016/j.apsusc.2015.09.248