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Lagger, P. W., Schiffmann, A., Pobegen, G., Pogany, D., & Ostermaier, C. (2013). Very Fast Dynamics of Threshold Voltage Drifts in GaN-Based MIS-HEMTs. IEEE Electron Device Letters, 34(9), 1112–1114. http://hdl.handle.net/20.500.12708/155268
