Record link: 
http://hdl.handle.net/20.500.12708/158988
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Title: 
Characterization of nano- and micrometer surface topographies applying angle-resolved light scattering : roughness monitoring in industrial finishing
en
Citation: 
Böhm, J. A. (2012). Characterization of nano- and micrometer surface topographies applying angle-resolved light scattering : roughness monitoring in industrial finishing [Dissertation, Technische Universität Wien]. reposiTUm. http://hdl.handle.net/20.500.12708/158988
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CatalogPlus: 
AC08911942
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Publication Type: 
Thesis - Dissertation
en
Language: 
English
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Authors: 
Böhm, Johannes Alois 
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Advisor: 
Vellekoop, Michael J. 
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Co-advisor: 
Vernes, András 
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Organisational Unit: 
E366 - Institut für Sensor- und Aktuatorsysteme 
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Date (published): 
2012
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Number of Pages: 
126
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Keywords: 
Metall; Oberfläche; Rauigkeitsmessung; Nephelometrie; Winkelauflösung
de
Additional information: 
Zsfassung in dt. Sprache
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Appears in Collections:
Thesis

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