Bodewits, E., Hoekstra, R., Kowarik, G., Dobes, K., & Aumayr, F. (2011). Highly-charged-ion-induced electron emission from C₆₀ thin films. Physical Review A, 84(042901). https://doi.org/10.1103/physreva.84.042901
E134-03 - Forschungsbereich Atomic and Plasma Physics
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Journal:
Physical Review A
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ISSN:
2469-9926
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Date (published):
2011
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Number of Pages:
6
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Publisher:
AMER PHYSICAL SOC
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Peer reviewed:
Yes
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Keywords:
Atomic and Molecular Physics, and Optics
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Abstract:
The secondary electron yields as a result of highly charged ions impinging on clean Au(111) and thin films of
C60 on Au have been measured. This has been done for film thicknesses of one to five monolayers and several
charge states of Ar and Xe ions. For all ions an increase of 35% in the secondary electron yield is observed when
going from Au(111) to multiple C60 layers. The increase remains constant for a wide range (7-26) of charge
states. Possible scenarios are given to explain the increase in electron yield.
