Synchrotron radiation-induced total reflection X-ray fluorescence (SR-TXRF)
analysis is a high sensitive analytical technique that offers limits of detection
in the femtogram range for most elements. Besides the analytical aspect,
SR-TXRF is mainly used in combination with angle-dependent measurements
and/or X-ray absorption near-edge structure (XANES) spectroscopy to gain
additional information about the investigated sample. In this article, we
briefly discuss the fundamentals of SR-TXRF and follow with several examples
of recent research applying the above-mentioned combination of techniques
to analytical problems arising from industrial applications and
environmental research.
