Record link: 
http://hdl.handle.net/20.500.12708/183038
-
Title: 
Secondary ion mass spectrometry analysis of trace elements distribution in high performance materials
en
Citation: 
Gammer, K. (2003). Secondary ion mass spectrometry analysis of trace elements distribution in high performance materials [Dissertation, Technische Universität Wien]. reposiTUm. http://hdl.handle.net/20.500.12708/183038
-
CatalogPlus: 
AC03829973
-
Publication Type: 
Thesis - Dissertation
en
Language: 
English
-
Authors: 
Gammer, Katharina 
-
Advisor: 
Hutter, Herbert 
-
Organisational Unit: 
E164 - Institut für Chemische Technologien und Analytik 
-
Date (published): 
2003
-
Number of Pages: 
135
-
Keywords: 
Sekundärionen-Massenspektrometrie; Hochleistungswerkstoff; Spurenelement
de
Additional information: 
Zsfassung in dt. Sprache
-
Appears in Collections:
Thesis

Show full item record

Page view(s)

34
checked on Dec 1, 2023

Google ScholarTM

Check