Semi-open-state testing for in-silicon coherent interconnects

Schult, Jasmin; Fiedler, Ben; Cock, David; Roscoe, Timothy

doi:10.34727/2024/isbn.978-3-85448-065-5_21

Record link:

http://hdl.handle.net/20.500.12708/200788
https://doi.org/10.34727/2024/isbn.978-3-85448-065-5_21

Title:

Semi-open-state testing for in-silicon coherent interconnects

Citation:

Schult, J., Fiedler, B., Cock, D., & Roscoe, T. (2024). Semi-open-state testing for in-silicon coherent interconnects. In N. Narodytska & P. Rümmer (Eds.), Proceedings of the 24th Conference on Formal Methods in Computer-Aided Design – FMCAD 2024 (pp. 153–162). TU Wien Academic Press. https://doi.org/10.34727/2024/isbn.978-3-85448-065-5_21

reposiTUm DOI:

10.34727/2024/isbn.978-3-85448-065-5_21

CatalogPlus:

AC17313123

Publication Type:

Inproceedings - Full-Paper Contribution

Language:

English

Authors:

Schult, Jasmin
Fiedler, Ben
Cock, David
Roscoe, Timothy

Editors:

Narodytska, Nina
Rümmer, Philipp