Record link: 
http://hdl.handle.net/20.500.12708/210490
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Title: 
Investigating Stress-Induced Change in Resonant Frequency of Silicon Nanowires
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Citation: 
Muzammil, M., Zarepakzad, S., Ali, B., Bostan Shirin, M., Kerimzade, U., & Alaca, B. E. (2024). Investigating Stress-Induced Change in Resonant Frequency of Silicon Nanowires. In A. Kocabaş & C. Kocabaş (Eds.), NANOTR-18 : Books of Abtracts (pp. 76–76). http://hdl.handle.net/20.500.12708/210490
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Publication Type: 
Inproceedings - Abstract Book Contribution
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Language: 
English
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Authors: 
Muzammil, Muhammad 
Zarepakzad, Sina 
Ali, Basit 
Bostan Shirin, Mehdi 
Kerimzade, Umut 
Alaca, B. Erdem 
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Organisational Unit: 
E366-02 - Forschungsbereich Mikrosystemtechnik 
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Published in: 
NANOTR-18 : Books of Abtracts 
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Date (published): 
Aug-2024
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Event name: 
NANOTR-18: 18th Nanoscience and Nanotechnology Conference 
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Event date: 
26-Aug-2024 - 28-Aug-2024
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Event place: 
Koç, Turkey
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Number of Pages: 
1
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Peer reviewed: 
Yes
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Keywords: 
Silicon Nanowires; Resonant Frequency; Stress-Induced Change
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Research Areas: 
Materials Characterization: 50%
Sensor Systems: 50%
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Science Branch: 
2020 - Elektrotechnik, Elektronik, Informationstechnik: 100%
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Appears in Collections:
Conference Paper

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