Record link: 
http://hdl.handle.net/20.500.12708/211568
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Title: 
Multiresolution analysis of 2D confocal microscope images
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Citation: 
Bianchi, D., Vernes, A., Vorlaufer, G., & Betz, G. (2010). Multiresolution analysis of 2D confocal microscope images. In C. Gorecki, A. Asundi, & W. Osten (Eds.), Optical Micro- and Nanometrology III. https://doi.org/10.1117/12.854498
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Publisher DOI: 
10.1117/12.854498
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Publication Type: 
Inproceedings - Full-Paper Contribution
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Language: 
English
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Authors: 
Bianchi, D. 
Vernes, Andras 
Vorlaufer, G. 
Betz, G. 
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Organisational Unit: 
E134-02 - Forschungsbereich Applied Interface Physics 
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Published in: 
Optical Micro- and Nanometrology III 
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ISBN: 
9780819481917
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Volume: 
7718
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Date (published): 
2010
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Event name: 
SPIE PHOTONICS EUROPE 
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Event date: 
12-Apr-2010 - 16-Apr-2010
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Event place: 
Brüssel, Belgium
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Number of Pages: 
5
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Peer reviewed: 
Yes
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Keywords: 
Lifting Scheme; Optical micro-metrology; Roughness Parameters; Topography; Wavelet; White Light Confocal Microscope
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Abstract: 
The functionality of the lifting is exploited scheme to analyze several white light confocal images of tribological/ engineering surfaces in terms of their roughness, waviness and form. The roughness parameters obtained are then compared with those resulting from other standard filtering techniques, like Gaussian filtering. Based on the wavelet transform, an attempt will also be made to provide a robust parameter for surface characterization. © 2010 Copyright SPIE - The International Society for Optical Engineering.
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Research Areas: 
Surfaces and Interfaces: 20%
Modeling and Simulation: 20%
Computational Materials Science: 60%
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Science Branch: 
1030 - Physik, Astronomie: 100%
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Appears in Collections:
Conference Paper

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